Defect scanning technology in the works

  • Author(s): Araman, Philip A.; Conners, R.
  • Date: 1994
  • Station ID: Miscellaneous Publication-SRS-

Abstract

This article describes the defect scanning technology being developed by Virginia Tech and U.S. Forest Service scientists in Blacksburg, Virginia to scan full sized hardwood lumber at industrial speeds.

  • Citation: Araman, Philip A.; Conners, R. 1994. Defect scanning technology in the works. Import/Export Wood Purchasing News

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